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NSLS II : Workshop on Soft X-ray Nanoprobe (SXN) beamline

May 16 @ 12:00 pm - 4:30 pm CDT

The Soft X-ray Nanoprobe (SXN) beamline, a new beamline under construction at NSLS-II, will offer researchers state-of-the-art soft X-ray nano-imaging and spectroscopy capabilities with world-leading coherent high photon flux in the energy range from 250 eV – 2500 eV. This two half-day workshop aims to bring experienced X-ray microscopy users, as well as new and early career users seeking practical guidance, together for scientific, technical, and training presentation and discussions. The first half-day workshop focuses on discussing the next generation of science questions that can be addressed with advances in instrument capabilities (Day-1). We aim also to discuss science cases suitable for the commissioning and optimization phase of the SXN beamline. The second half-day workshop focuses on practical aspects of X-ray imaging and spectromicroscopy research (Day-2) and discussion of existing approaches and requirements including sample preparation, choosing the best instrument for your research question, research workflow, data handling, and multi-modal approaches.

Session I: Research Areas (overview of high impact science cases of soft X-ray nanoscale imaging and spectromicroscopy); Thursday, May 16, 2024 (EDT 1:00 – 5:30 p.m.)

Session II: Application (details from sample preparation, experimental design to data analysis and interpretation); Friday, May 17, 2024 (EDT 1:00 – 5:30 p.m.)

Organizers: Wen Hu (NSLS-II), Brandy Toner (University of Minnesota), Andrew Walter (NSLS-II), Joe Dvorak (NSLS-II), Jiemin Li (NSLS-II)


Brookhaven National Laboratory, 743 Brookhaven Avenue
Upton, NY 11973-5000 United States
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(631) 344-8737
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