Fast Scanning Transmission X-ray Microscopy: Enabling New Science Today and at the ALS-U
Dr. Alex Ditter (LBNL)
Thursday November 21: 9am Seattle; 11am Saskatoon; 12 noon New York; 2pm Rio de Janeiro; 5pm London; 6pm Berlin; 7pm Cape Town; 8pm Amman; 2am (11/22) Tokyo; 4am (11/22) Melbourne
Link:
https://washington.zoom.us/j/95725226444
Many recent and planned upgrades to lightsources around the world are focused on improving emittance and maximizing coherent flux.1 Scanning Transmission X-ray Microscopes (STXMs) and ptychography beamlines can use these improvements only if detector speed, scanning speed, data pipelines, and data analysis tools are able to keep up. We will discuss here a brief overview of Advanced Light Source (ALS) Beamline 7.0.1.22, 3 and focus on recent developments in improving scanning speed. This is accomplished through the implementation of a spiral scan pattern originally developed for atomic force microscopy,4 and which improves scanning time by a factor of 3-5. This not only improves throughput but also enables new science as demonstrated by large population particle measurements and the observation of in situ dynamics on the time scale of seconds. We will also discuss how fast scanning will tie into other beamline improvements planned for the ALS upgrade.